Consolidated data management and post-processing tool that increases reporting productivity for connector endface inspection and all types of optical-layer testing including optical link mapping (iOLM), OTDR, ORL, loss, PMD and chromatic dispersion.
Consolidated data management and post-processing tool that increases reporting productivity for connector endface inspection and all types of optical-layer testing including optical link mapping (iOLM), OTDR, ORL, loss, PMD and chromatic dispersion.